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Apple ASIC Design Engineer Interview

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Average Interview – Overall Positive Experience – No – Wed, 27 Jul 2016

Interviewed Jul 2,016 in San Jose, CA
General questions with digital design. Some areas included Clock domain crossing, affect of voltage, temperature on mestability of flop, FIFO, implementation of dual port RAM using single port RAM. what are the different techniques to accomplish this like doubling the clock frequency, memory banking or doubling the amount of data stored in the RAM.

Interview Questions
Know the details of your past work experience.
Answer Question

Other Details
The interview consisted of Phone Interview


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